发明名称 ETCH STOP LAYER IN POLY-METAL STRUCTURES
摘要 In accordance with one embodiment of the present invention, a method of interfacing a poly-metal structure and a semiconductor substrate is provided where an etch stop layer is provided in a polysilicon region of the structure. The present invention also addresses the relative location of the etch stop layer in the polysilicon region and a variety of structure materials and oxidation methods.
申请公布号 US2007093025(A1) 申请公布日期 2007.04.26
申请号 US20060561988 申请日期 2006.11.21
申请人 发明人 AGARWAL VISHNU K.
分类号 H01L21/336 主分类号 H01L21/336
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