发明名称 Interconnection structures for semiconductor devices and methods of forming the same
摘要 An interconnection structure includes an inter-level insulation layer disposed on a semiconductor substrate. First contact structures are formed in the inter-level insulation layer. Second contact structures are formed in the inter-level insulation layer and are spaced apart from the first contact structures. First spacers are disposed between the first contact structures and the inter-level insulation layer. Second spacers are disposed between the second contact structures and the inter-level insulation layer. Metal interconnections are disposed on the inter-level insulation layer and connected to the first and second contact structures. The first contact structures include first and second plugs stacked in sequence, the second contact structures include the second plugs, and the first spacers include an upper spacer disposed between the second plug and the inter-level insulation layer.
申请公布号 US2007093050(A1) 申请公布日期 2007.04.26
申请号 US20060541027 申请日期 2006.09.29
申请人 发明人 SON SUK-JOON;PARK JONG-HO;KIM HYUN-SUK
分类号 H01L21/4763 主分类号 H01L21/4763
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