发明名称 Wafer edge cleaning process
摘要 A method of processing a semiconductor wafer can be used prior to an immersion lithography process. The method includes providing a layer of organic photoresist onto a surface of the semiconductor wafer and removing a portion of the photoresist from an outer edge of the wafer using an edge-bead removal process. The outer edge of the wafer is then cleaned using one or more processes, including a mechanical scrubber/cleaner, mega-sonic power, de-ionized water and/or chemical solution.
申请公布号 US2007093067(A1) 申请公布日期 2007.04.26
申请号 US20050256711 申请日期 2005.10.24
申请人 TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD. 发明人 CHANG CHING-YU;LIN BURN J.
分类号 H01L21/302;H01L21/461 主分类号 H01L21/302
代理机构 代理人
主权项
地址