发明名称 Recess channel transistor for preventing deterioration of device characteristics due to misalignment of gate layers and method of forming the same
摘要 The recess channel transistor includes: a semiconductor substrate including a device insulation layer defining an activation region in which recesses are formed; insulation buffer patterns, each of which is formed at an opening of the recess on a surface of the substrate; gates, each of which includes a recess gate formed in the recess and a top gate formed on the substrate; spacers, each of which is formed at both sides of the gate; and a source region and a drain region formed at both sides of each gate on the surface of the substrate, where the source and drain regions have an even doping profile due to the existence of insulation buffer patterns. Accordingly, characteristics of the transistor can be prevented from deteriorating due to misalignment of the top gate with the recess gate.
申请公布号 US2007090452(A1) 申请公布日期 2007.04.26
申请号 US20050299544 申请日期 2005.12.12
申请人 CHO GYU SEOG;KIM YONG TAIK 发明人 CHO GYU SEOG;KIM YONG TAIK
分类号 H01L21/336;H01L29/94 主分类号 H01L21/336
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