| 摘要 |
A system is disclosed which can easily search and determine the effective feature amount suitable for determining the normality/abnormality of an object to be inspected in an inspection/diagnosis apparatus and the various parameters for calculating the effective feature amount. A parameter search unit searches for the various parameters used for calculating the feature amount. A feature amount calculation unit calculates a plurality of feature amounts based on the various parameters searched by the parameter search unit from a given sample data including the normal and abnormal data. An assessment unit outputs the excellence of the various parameters as an assessment value from the result of calculation of the feature amount determined by the feature amount calculation unit. The parameter search unit searches the various parameters again based on the assessment result of the assessment unit thereby to determine an effective feature amount a high assessment value and the various parameters for the particular effective feature amount at the same time. |
