发明名称 Charge compensated dielectric layer structure and method of making the same
摘要 A method of forming a semiconductor structure comprises providing an insulator layer overlying a III-V compound substrate, the insulator layer having a surface charge layer, the surface charge layer having a deleterious performance effect on the underlying layer or layers of the III-V compound substrate. The method further comprises transforming the surface charge layer into a passivated surface layer, wherein the passivated surface layer reduces the deleterious performance effect on the underlying layer or layers.
申请公布号 US2007090405(A1) 申请公布日期 2007.04.26
申请号 US20050236187 申请日期 2005.09.27
申请人 PASSLACK MATTHIAS;DROOPAD RAVINDRANATH;RAJAGOPALAN KARTHIK 发明人 PASSLACK MATTHIAS;DROOPAD RAVINDRANATH;RAJAGOPALAN KARTHIK
分类号 H01L23/58 主分类号 H01L23/58
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