摘要 |
A method of forming a semiconductor structure comprises providing an insulator layer overlying a III-V compound substrate, the insulator layer having a surface charge layer, the surface charge layer having a deleterious performance effect on the underlying layer or layers of the III-V compound substrate. The method further comprises transforming the surface charge layer into a passivated surface layer, wherein the passivated surface layer reduces the deleterious performance effect on the underlying layer or layers.
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