发明名称 |
METHOD AND DEVICE FOR MEASURING SPHERICAL ABERRATION IN ELECTROMAGNETIC LENS |
摘要 |
PROBLEM TO BE SOLVED: To provide a measurement method and a measuring device of the spherical aberration of an electromagnetic lens capable of precisely measuring the spherical aberration coefficient of the actual electromagnetic lens. SOLUTION: Electron beams through an objective lens (electromagnetic lens) 16 are allowed to enter a single-crystal sample 20 whose lattice constant is known, and the image data of a Ronchigram is acquired by an imaging device 18. A control section 10 inputs the image data of the Ronchigram from the image pickup device 18, performs image processing, calibrates the scale of the image, and calculates the spherical aberration coefficient from the slope of a straight line obtained by fitting a line intensity profile. COPYRIGHT: (C)2007,JPO&INPIT
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申请公布号 |
JP2007109509(A) |
申请公布日期 |
2007.04.26 |
申请号 |
JP20050298799 |
申请日期 |
2005.10.13 |
申请人 |
FUJITSU LTD;TOKYO UNIV OF SCIENCE |
发明人 |
ODAKA YASUTOSHI;NAKANISHI NOBUTO;YAMAZAKI TAKASHI;WATANABE KAZUTO |
分类号 |
H01J37/153;H01J37/22;H01J37/28 |
主分类号 |
H01J37/153 |
代理机构 |
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主权项 |
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地址 |
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