发明名称 LOGICAL CIRCUIT FOR EVALUATING SUBSTRATE POWER SUPPLY, AND SUBSTRATE POWER SUPPLY EVALUATION METHOD
摘要 PROBLEM TO BE SOLVED: To provide a logical circuit for evaluating substrate power supply and substrate power supply evaluation method, capable of evaluating anti power supply noise and cut and divide the defective part at the time of occurrence of malfunction. SOLUTION: A logic circuit 1 for substrate power supply for evaluation for assembling into the logic element device mounted on the product substrate is provided with: a circuit 2 for simulating the action of the logic element device with an arbitrary frequency to the usage rate variable using the prescribed circuit among the usable all logic element devices; a circuit 3 for determining the normal/abnormal of the circuit 2; a circuit 4 for setting a using rate when the operation stop is indicate to the circuit 2 by controlling the execution of the circuit 2 based on the result of the determination of the circuit 3; and a circuit 5 for outputting the result of the determination of the circuit 3 and the usage rate set by the circuit 4 externally. COPYRIGHT: (C)2007,JPO&INPIT
申请公布号 JP2007107905(A) 申请公布日期 2007.04.26
申请号 JP20050296198 申请日期 2005.10.11
申请人 MITSUBISHI ELECTRIC CORP 发明人 KUSANO YOSHIYUKI;SHIMAZAKI MUTSUMI;HORIKOSHI MIKA;YAMANAKA YASUHIRO;SAKAI HIROAKI
分类号 G01R31/28 主分类号 G01R31/28
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