发明名称 |
Methods and apparatus for inspecting an object using structured light |
摘要 |
A method and apparatus for inspecting an object (12) using a light measurement system (10) that includes a light source (22) and an imaging sensor (24). This includes emitting light from the light source, dispersing light emitted from the light source into one of a diffraction pattern and an interference pattern, and imaging the patterned light onto the object using a lens (38). |
申请公布号 |
EP1777490(A2) |
申请公布日期 |
2007.04.25 |
申请号 |
EP20060255432 |
申请日期 |
2006.10.23 |
申请人 |
GENERAL ELECTRIC COMPANY |
发明人 |
HARDING, KEVIN GEORGE;TAIT, ROBERT WILLIAM;DEMUTH, RUSSELL STEPHEN |
分类号 |
G01B11/25 |
主分类号 |
G01B11/25 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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