发明名称 OPTICAL INSPECTION SYSTEM
摘要 An optical inspection system includes a first optical module and a second optical module. The first optical module includes a first light source having a first optical axis and a first image capturing unit having a first image capturing axis. The first optical axis and the first image capturing axis are symmetric relative a normal line of an inspection plane. A first angle is formed between the first optical axis and the first image capturing axis. The second optical module includes a second light source having a second optical axis and a second image capturing unit having a second image capturing axis. The second optical axis and the second image capturing axis are symmetric relative to the normal line. A second angle is formed between the second optical axis and the second image capturing axis and is different from the first angle.
申请公布号 US2016169812(A1) 申请公布日期 2016.06.16
申请号 US201414570296 申请日期 2014.12.15
申请人 Test Research, Inc. 发明人 YU Liang-Pin;WEN Kuang-Pu;WANG Yeong-Feng
分类号 G01N21/88;G01B11/24;H04N7/18 主分类号 G01N21/88
代理机构 代理人
主权项 1. An optical inspection system for inspecting a device under test, the optical inspection system comprising: a first optical module, comprising: a first light source having a first optical axis; anda first image capturing unit having a first image capturing axis, wherein the first optical axis and the first image capturing axis are symmetric relative a normal line of an inspection plane on the device under test, and a first angle is formed between the first optical axis and the first image capturing axis; and a second optical module, comprising: a second light source having a second optical axis; anda second image capturing unit having a second image capturing axis, wherein the second optical axis and the second image capturing axis are symmetric relative to the normal line, a second angle is formed between the second optical axis and the second image capturing axis, and the second angle is different from the first angle.
地址 Taipei City TW