Methods and apparatus for generating a mask for inspecting an object using structured light

摘要

A method (100) and apparatus for generating a mask (52) for use with a light measurement system (10) that includes a light source (22) for projecting light onto a surface of an object (12), and an imaging system for receiving light reflected from the surface of the object. A profile of the object to be inspected is determined and a mask based on the determined profile is generated, wherein the mask includes an opening (172) extending therethrough that has a profile that substantially matches a profile of the object as viewed from the light source.