发明名称 Method and apparatus for peeling a surface protective film
摘要 A method and an apparatus for peeling a surface protective film (3) attached on the surface of a semiconductor wafer (1) are provided. A heating block (12) is set in proximity to the whole surface of the semiconductor wafer (1), and the whole surface protective film (3) is heated by the heating block. Thus, the air bubbles (50) existing between the semiconductor wafer (1) and the surface protective film (3) are expanded or swelled, and the adhesion between the semiconductor wafer and the surface protective film is weakened. After that, the surface protective film (3) is peeled from the semiconductor wafer (1). As a result, a peel starting point can be appropriately formed and damage to the wafer can be prevented.
申请公布号 EP1777734(A2) 申请公布日期 2007.04.25
申请号 EP20060122246 申请日期 2006.10.13
申请人 TOKYO SEIMITSU CO., LTD. 发明人 KANAZAWA, MASAKI;AMETANI, MINORU;AKITA, DAISUKE;NEZU, MOTOI
分类号 H01L21/00;H01L21/68 主分类号 H01L21/00
代理机构 代理人
主权项
地址