发明名称 SEMICONDUCTOR DEVICE WITH AIR GAP AND METHOD OF FABRICATING THE SAME
摘要 A method of fabricating a semiconductor device and a semiconductor device formed by the method. The method includes form a stack conductive structure by stacking a first conductive pattern and an insulation pattern over a substrate; forming a sacrificial pattern over sidewalls of the stack conductive structure; forming a second conductive pattern having a recessed surface lower than a top surface of the stack conductive structure; forming a sacrificial spacer to expose sidewalls of the insulation pattern by removing an upper portion of the sacrificial pattern; reducing a width of the exposed portion of the insulation patters; forming a capping spacer to cap the sidewalls of the insulation pattern having the reduced width over the sacrificial spacer; and forming an air gap between the first conductive pattern and the second conductive pattern by converting the sacrificial spacer to volatile byproducts.
申请公布号 US2016197003(A1) 申请公布日期 2016.07.07
申请号 US201615070700 申请日期 2016.03.15
申请人 SK hynix Inc. 发明人 KIM Myung-Ok
分类号 H01L21/768;H01L27/108;H01L21/285 主分类号 H01L21/768
代理机构 代理人
主权项
地址 Gyeonggi-do KR