发明名称 |
Method for correcting inter-pin spotting amount error for a microarray |
摘要 |
The present invention has an objective of obtaining more accurate data of microarray experiments by correcting an inter-pin spotting amount error caused upon microarray production using a plurality of pins. Upon microarray production, samples are immobilized on a microarray support using all pins as controls for correcting the inter-pin spotting amount errors. After the microarray experiments, luminescent intensities of the samples used as control spots for correcting the inter-pin spotting amount errors are measured and used to obtain correction parameters for the inter-pin spotting amount errors of respective pins. These parameters are used to correct luminescent intensities of other samples.
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申请公布号 |
US7208277(B2) |
申请公布日期 |
2007.04.24 |
申请号 |
US20040784227 |
申请日期 |
2004.02.24 |
申请人 |
HITACHI SOFTWARE ENGINEERING CO., LTD. |
发明人 |
YAMAMOTO TOMOYUKI;TAMURA TAKURO |
分类号 |
C12Q1/68;G01N33/53;B01J19/00;B01L3/02;C12M1/00;C12M1/36;C12N15/09;C40B40/06;C40B40/10;C40B60/14;G01N1/00;G01N15/06;G01N33/566;G01N35/02;G01N35/10;G01N37/00 |
主分类号 |
C12Q1/68 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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