发明名称 3D Microscopy With Illumination Engineering
摘要 The present disclosure provides improved microscopic imaging techniques, equipment and systems. More particularly, the present disclosure provides advantageous microscopy assemblies with illumination engineering (e.g., 3D microscopy assemblies with illumination engineering), and related methods of use. Disclosed herein is an imaging technique/assembly that uses a spatial light modulator (“SLM”) for 3D tomographic imaging with brightfield or fluorescence illumination that can also be utilized for bright-field, dark-field, phase-contrast, and super-resolution microscopy. Disclosed herein are methods and instrumentation/assemblies having preferred uses for 3D tomographic imaging, and phase-contrast and super-resolution imaging. The present disclosure advantageously provides for assemblies and methods configured to create 3D tomographic images by way of acquiring a series of images with varied angle illumination using a SLM and computational reconstruction that substantially eliminates the need to move the sample. The disclosed assemblies and methods are also able to acquire bright-field, dark-field, various contrast, and super-resolution images.
申请公布号 US2016202460(A1) 申请公布日期 2016.07.14
申请号 US201614993290 申请日期 2016.01.12
申请人 University of Connecticut 发明人 Zheng Guoan
分类号 G02B21/00;H04N5/225 主分类号 G02B21/00
代理机构 代理人
主权项 1. An imaging assembly comprising: a light source and an imaging sensor; a condenser, a detection optics member and a tube lens or camera adapter, the condenser, detection optics member and the tube lens or camera adapter positioned between the light source and the imaging sensor; and a digitally controlled spatial light modulator positioned between the light source and the imaging sensor, the digitally controlled spatial light modulator configured and adapted to provide three-dimensional tomographic imaging of a sample.
地址 Farmington CT US