发明名称 Transistor with notched gate
摘要 A transistor having a gate electrode with a T-shaped cross section is fabricated from a single layer of conductive material using an etching process. A two process etch is performed to form side walls having a notched profile. The notches allow source and drain regions to be implanted in a substrate and thermally processed without creating excessive overlap capacitance with the gate electrode. The reduction of overlap capacitance increases the operating performance of the transistor, including drive current.
申请公布号 US7208399(B2) 申请公布日期 2007.04.24
申请号 US20040897351 申请日期 2004.07.22
申请人 INTEL CORPORATION 发明人 CHU CHARLES;LETSON THOMAS A.
分类号 H01L21/302;H01L21/3205;H01L21/28;H01L21/3065;H01L21/3213;H01L21/336;H01L29/423;H01L29/78 主分类号 H01L21/302
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