发明名称 Method of manufacturing a semiconductor device comprising stacked chips and a corresponding semiconductor device
摘要 A first reconstituted wafer is formed, followed by a first redistribution layer. In parallel, a second reconstituted wafer is formed. The second reconstituted wafer is diced along a gap such that individualized embedded chips are formed having tilted sidewalls defining an angle of more than 90 degrees with respect to the active surface of the reconstituted wafer. The embedded chips are placed with the backside on an active surface of the first reconstituted wafer on the first redistribution layer. Afterwards, a second redistribution layer is formed on the active surface of the embedded chips and tilted sidewalls wherein the second redistribution layer connects contact pads of the second chips with the first redistribution layer.
申请公布号 US7208345(B2) 申请公布日期 2007.04.24
申请号 US20050126392 申请日期 2005.05.11
申请人 INFINEON TECHNOLOGIES AG 发明人 MEYER THORSTEN;HEDLER HARRY
分类号 H01L21/48;H01L21/50 主分类号 H01L21/48
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