Matching semiconductor circuits

摘要

Devices, circuitry, and methods for improving matching between semiconductor circuits are shown and described. Measuring a difference in matching between semiconductor circuits may be performed with a test current generator and test current measurement circuit, and adjusting a threshold voltage of a semiconductor component of at least one circuit until the difference between the circuits is at a desired difference may be performed with a program circuit.

主权项

1. A method of matching semiconductor circuits, comprising:
measuring a difference in matching between the semiconductor circuits; adjusting a threshold voltage of a semiconductor component of at least one of the semiconductor circuits in a permanent manner using a particular circuit until the difference between the semiconductor circuits is at a desired difference; and isolating the semiconductor component from the particular circuit for operation of the semiconductor circuits.