Method for image outlier removal for transmission electron microscope cameras

摘要

Methods are disclosed for removal of outlier pixels from a transmission electron microscopy camera image. One exemplary method includes establishing a desired exposure of n electrons per pixel; exposing the camera to a series of sub-frame exposures to produce a series of sub-frame images; calculating an average image signal of all sub-frame exposures in said series; establishing a threshold selected to achieve a desired number of false positives; evaluating each of said sub-frame exposures for pixels further away from said average than said threshold; and replacing pixels in each of said sub-frame images that exceed said threshold with said average to form corrected sub-frame images.

主权项

1. A method for removal of outlier pixels from a transmission electron microscopy camera image comprising:
a. establishing a desired exposure of n electrons per pixel; b. exposing the camera to a series of sub-frame exposures to produce a series of sub-frame images; c. calculating an average image signal of all sub-frame exposures in said series; d. establishing a threshold selected to achieve a desired number of false positives; e. evaluating each of said sub-frame exposures for pixels further away from said average than said threshold; and f. replacing pixels in each of said sub-frame images that exceed said threshold with said average to form corrected sub-frame images.