发明名称 High-density power MOSFET with planarized metalization
摘要 A method for producing a power MOSFET. The method includes fabricating a plurality of layers of a power MOSFET to produce an upper surface active area and performing a chemical mechanical polishing process on the active area to produce a substantially planar surface. A metalization deposition process is then performed on the substantially planar surface and the fabrication of the power MOSFET is subsequently completed.
申请公布号 US9437729(B2) 申请公布日期 2016.09.06
申请号 US200711651258 申请日期 2007.01.08
申请人 Vishay-Siliconix 发明人 Li Jian
分类号 H01L21/3205;H01L29/78;H01L29/417;H01L21/306;H01L29/45 主分类号 H01L21/3205
代理机构 代理人
主权项 1. A method for producing a power MOSFET, comprising: fabricating a plurality of layers of a power MOSFET and an integrated Schottky device to produce an upper surface active area; performing a chemical mechanical polishing process on the upper surface active area to produce a substantially planar surface, wherein a gate contact is coplanar with an oxide deposit, wherein the oxide deposit comprises a source region, and wherein the oxide deposit comprises a drain region; performing a metalization deposition process on the substantially planar surface, wherein a portion of the metallization deposition is in contact with the gate contact; and completing fabrication of the power MOSFET and Schottky device.
地址 Santa Clara CA US