发明名称 |
High-density power MOSFET with planarized metalization |
摘要 |
A method for producing a power MOSFET. The method includes fabricating a plurality of layers of a power MOSFET to produce an upper surface active area and performing a chemical mechanical polishing process on the active area to produce a substantially planar surface. A metalization deposition process is then performed on the substantially planar surface and the fabrication of the power MOSFET is subsequently completed. |
申请公布号 |
US9437729(B2) |
申请公布日期 |
2016.09.06 |
申请号 |
US200711651258 |
申请日期 |
2007.01.08 |
申请人 |
Vishay-Siliconix |
发明人 |
Li Jian |
分类号 |
H01L21/3205;H01L29/78;H01L29/417;H01L21/306;H01L29/45 |
主分类号 |
H01L21/3205 |
代理机构 |
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代理人 |
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主权项 |
1. A method for producing a power MOSFET, comprising:
fabricating a plurality of layers of a power MOSFET and an integrated Schottky device to produce an upper surface active area; performing a chemical mechanical polishing process on the upper surface active area to produce a substantially planar surface, wherein a gate contact is coplanar with an oxide deposit, wherein the oxide deposit comprises a source region, and wherein the oxide deposit comprises a drain region; performing a metalization deposition process on the substantially planar surface, wherein a portion of the metallization deposition is in contact with the gate contact; and completing fabrication of the power MOSFET and Schottky device. |
地址 |
Santa Clara CA US |