发明名称 Method of forming local interconnects and conductive lines, and resulting structure
摘要 The invention relates to a method of forming a local interconnect (57). The method comprises forming at least two transistor gates (22, 26) over a semiconductor substrate (12). A local interconnect layer (56) is deposited to overlie at least one of the transistor gates (22, 26) and interconnect at least one source/drain region (42) proximate one of the transistor gates (22) with semiconductor substrate material (12) proximate another of the transistor gates (26). Conductivity enhancing impurity is implanted through the local interconnect layer (56) into semiconductor substrate material (12) therebeneath.
申请公布号 EP1775763(A2) 申请公布日期 2007.04.18
申请号 EP20060019579 申请日期 2000.03.10
申请人 MICRON TECHNOLOGY, INC. 发明人 MANNING, H., MONTGOMERY
分类号 H01L21/768;H01L21/265;H01L21/8234;H01L23/485;H01L27/088 主分类号 H01L21/768
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