发明名称 Anti-scattering attenuator structure for high energy particle radiation into integrated circuits
摘要 A microelectronics device including a semiconductor device located at least partially over a substrate, a bombarded area located at least partially over the substrate and adjacent the semiconductor device, and a bombarded attenuator interposing the semiconductor device and the bombarded area.
申请公布号 US7205632(B2) 申请公布日期 2007.04.17
申请号 US20040818009 申请日期 2004.04.05
申请人 TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD. 发明人 LIN WEN-CHIN;TANG DENNY D.;WANG CHAO-HSIUNG
分类号 H01L29/00;G01J1/42;H01L27/06;H01L27/08 主分类号 H01L29/00
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