发明名称 Micro-feature fill process and apparatus using hexachlorodisilane or other chlorine-containing silicon precursor
摘要 A method is provided for depositing a silicon-containing film in a micro-feature on a substrate by a low pressure deposition process in a processing system. A silicon-containing film can be formed in a micro-feature by providing a substrate in a process chamber of a processing system, and exposing a hexachlorodisilane (HCD) process gas to the substrate. A processing tool containing a processing system for forming a silicon-containing film in a micro-feature using a silicon and chlorine-containing gas such as a HCD process gas is provided. Alternatively, the micro-feature can be exposed to DCS, SiCl<SUB>4</SUB>, and SiHCl<SUB>3 </SUB>gases. Alternatively, the micro-feature can be exposed to (SiH<SUB>4</SUB>+HCl).
申请公布号 US7205187(B2) 申请公布日期 2007.04.17
申请号 US20050035730 申请日期 2005.01.18
申请人 TOKYO ELECTRON LIMITED 发明人 LEITH ALLEN JOHN;DIP ANTHONY;OH SEUNGHO
分类号 H01L21/336;H01L21/8234 主分类号 H01L21/336
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