发明名称 Method of testing electric circuit, and arrangement
摘要 A method of testing an electric circuit and an arrangement for implementing the method are provided. The arrangement includes a current source connected to a network of electric components, the current source for supplying current to at least one current path of the network, the network being characterized with a predefined network configuration; a measurement unit connected to the network, the measurement unit for measuring effective values of node voltages in at least two nodes of the at least one current path, a node representing an equipotential point of adjacent electric components; and a processing unit connected to the measurement unit, the processing unit for deriving a characterizing value of at least one electric component of the network by using the effective value of current, the effective values of the node voltages, and the predefined network configuration.
申请公布号 US7206547(B2) 申请公布日期 2007.04.17
申请号 US20030675414 申请日期 2003.09.30
申请人 NOKIA CORPORATION 发明人 VOUTILAINEN JUHA-VEIKKO;SAIKKONEN TEUVO
分类号 H04B17/00;H04M1/24 主分类号 H04B17/00
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