发明名称 IC TESTER
摘要 The purpose of the invention is to achieve an integrate circuit tester which can perform accurate test even if current is supplied or extracted for the test object. The invention improves the integrate circuit tester for testing the test object. The device is provided with: a current unit which supplies or extractes current on the output lead of the test object; and a mensurating unit which performs voltage mensurating on the output lead of the test object and correcting the tested voltage based on an output resistance value of the test object and a current value of the current unit.
申请公布号 KR20070040292(A) 申请公布日期 2007.04.16
申请号 KR20060084227 申请日期 2006.09.01
申请人 YOKOGAWA ELECTRIC CORPORATION 发明人 NAGANUMA HIDEKI
分类号 G01R31/26;G01R31/28 主分类号 G01R31/26
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