发明名称 semiconductor device
摘要 In a masking pattern (a) for patterning word and data lines, length is changed between adjacent word lines so as to be shifted from each other at their tips, and furthermore, the tip of each word line is cut obliquely. It is thus possible to prevent the resist pattern from separation and contact of adjacent patterns. Consequently, it is also possible to prevent break failures of patterned lines and short failures between those patterned lines.
申请公布号 KR100706126(B1) 申请公布日期 2007.04.13
申请号 KR20060100427 申请日期 2006.10.16
申请人 发明人
分类号 H01L27/10;G03F1/00;G03F1/32;G03F1/36;G03F1/68;G03F7/20;H01L21/027;H01L21/3213;H01L21/8242;H01L23/528;H01L27/105 主分类号 H01L27/10
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