发明名称 NONVOLATILE MEMORY ELEMENT
摘要 PROBLEM TO BE SOLVED: To provide a nonvolatile memory element for solving various problems of the conventional technologies. SOLUTION: The nonvolatile memory element comprises a memory cell and a high-voltage MOS transistor. The memory cell is provided in a memory array region, and comprises a PMOS access transistor and a PMOS storage transistor connected in series to the access transistor via a floating and common p-type doped region. The PMOS access transistor comprises an access gate, an access gate oxide film, and a p-type source doped region used for its drain. The PMOS storage transistor comprises a control gate, a charge storing structure, and a p-type drain doped region used for its source. The high-voltage MOS transistor is provided in a peripheral circuit region and comprises a high-voltage gate and a high-voltage gate oxide film, having thickness matching that of the access gate oxide film. COPYRIGHT: (C)2007,JPO&INPIT
申请公布号 JP2007096038(A) 申请公布日期 2007.04.12
申请号 JP20050284215 申请日期 2005.09.29
申请人 EMEMORY TECHNOLOGY INC 发明人 CHEN HSIN MING;LEE HAI-MING;CHIN SHIKETSU;JO SEISHO
分类号 H01L21/8247;H01L21/8234;H01L27/088;H01L27/10;H01L27/115;H01L29/788;H01L29/792 主分类号 H01L21/8247
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