发明名称 PROBE SUPPORT, PROBE DEVICE, AND IN-VIVO COMPONENT MEASURING APPARATUS
摘要 PROBLEM TO BE SOLVED: To provide a probe support which can bring the distal end section of a probe into contact with a measured area at a proper pressure, and enables an in-vivo component measurement with a good accuracy to be performed, and to provide a probe device utilizing the characteristics of the probe support, and to provide an in-vivo component measuring apparatus. SOLUTION: This probe support 1 is equipped with a frame body 10 of which the cross sectional shape seen from the end surface in the longitudinal direction is an approximately trapezoidal shape, and makes the lower surface of the frame body 10 as a contact surface 11 which is brought into contact with a subject's living body A. At the center part of the contact surface 11, one end of a hole section 12 having a circular cross section which internally houses a cylindrical skin contact element 20 of the probe 2 and guides the movement in the vertical direction is opened. Also, the hole section 12 incorporates a baffle plate 16 which vertically moves by being screwed with a screw 15 for adjustment in the vertical direction from outside of the frame body 10. The upper surface position of the skin contact element 20 of the probe 2 is restricted by the position of the lower surface of the baffle plate 16, so that a projecting amount of the contact surface 21 is fixed. COPYRIGHT: (C)2007,JPO&INPIT
申请公布号 JP2007089708(A) 申请公布日期 2007.04.12
申请号 JP20050280949 申请日期 2005.09.27
申请人 MATSUSHITA ELECTRIC WORKS LTD 发明人 TSURUKI MITSUHIRO;MARUO KATSUHIKO
分类号 A61B5/1455 主分类号 A61B5/1455
代理机构 代理人
主权项
地址