发明名称 HIGH DENSITY, HIGH Q CAPACITOR ON TOP OF PROTECTIVE LAYER
摘要 <p>In accordance with the invention, there are methods for making and there is an integrated circuit (100) comprising a semiconductor substrate (105) comprising device elements and a metallization layer (110) interconnecting the device elements and having an uppermost layer (115). The integrated circuit can also include a protective overcoat (120) formed over the metallization layer, the protective overcoat having a plurality of patterned regions (116a-c) that expose portions of the metallization layer, a first conductive layer (125) formed on the protective overcoat, and a dielectric layer formed over the first conductive layer. The integrated circuit can further include a second conductive layer (160) formed over the dielectric layer and a plurality of sidewall spacers (142) contacting end portions of the first conductive layer.</p>
申请公布号 WO2007041504(A1) 申请公布日期 2007.04.12
申请号 WO2006US38454 申请日期 2006.09.29
申请人 TEXAS INSTRUMENTS INCORPORATED;WILLIAMS, BYRON, LOVELL;LIPPITT, MAXWELL, WALHOUR, III;CRENSHAW, DARIUS;NG, LAURINDA;MERCER, BETTY;MONTGOMERY, SCOTT, KELLY;THOMPSON, MATTHEW 发明人 WILLIAMS, BYRON, LOVELL;LIPPITT, MAXWELL, WALHOUR, III;CRENSHAW, DARIUS;NG, LAURINDA;MERCER, BETTY;MONTGOMERY, SCOTT, KELLY;THOMPSON, MATTHEW
分类号 H01L29/00;H01L21/20;H01L23/522 主分类号 H01L29/00
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