发明名称 GALLIUM NITRIDE BASED STRUCTURES INCLUDING SUBSTRATES AND MANUFACTURING METHODS THEREOF
摘要 Gallium nitride material-based semiconductor structures are provided. In some embodiments, the structures include a composite substrate over which a gallium nitride material region is formed. The gallium nitride material structures may include additional features, such as strain-absorbing layers and/or transition layers, which also promote favorable stress conditions. The reduction in stresses may reduce defect formation and cracking in the gallium nitride material region, as well as reducing warpage of the overall structure. The gallium nitride material-based semiconductor structures may be used in a variety of applications such as transistors (e.g. FETs) Schottky diodes, light emitting diodes, laser diodes, SAW devices, and sensors, amongst others devices.
申请公布号 WO2006127227(A3) 申请公布日期 2007.04.12
申请号 WO2006US17098 申请日期 2006.05.03
申请人 NITRONEX CORPORATION;PINER, EDWIN, L.;RAJAGOPAL, PRADEEP;ROBERTS, JOHN, C.;LINTHICUM, KEVIN, J. 发明人 PINER, EDWIN, L.;RAJAGOPAL, PRADEEP;ROBERTS, JOHN, C.;LINTHICUM, KEVIN, J.
分类号 H01L29/267;H01L21/18;H01L21/20;H01L21/335;H01L21/84;H01L29/778 主分类号 H01L29/267
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