| 摘要 |
<p><P>PROBLEM TO BE SOLVED: To provide a method and equipment for inspecting a light emitting element array with high precision in a short time. <P>SOLUTION: The equipment 40 for inspecting a light emitting element array 25 comprises a line sensor camera 48 for imaging a light emitting element array 25 having an organic EL element, and a moving table 42 and a conveyance mechanism 43 for arranging the organic EL element in the imaging range of the line sensor camera 48 by conveying the light emitting element array 25. An inspection terminal provided in the inspection equipment 40 is equipped with an image processor for processing digital image data obtained by imaging the organic EL element and judging whether light emitting state of the organic EL element is acceptable or not. <P>COPYRIGHT: (C)2007,JPO&INPIT</p> |
