发明名称 WAFER HEATING APPARATUS
摘要 PROBLEM TO BE SOLVED: To solve the subject that, since the resistance temperature coefficient of a heat-generating resistor is as large as more than 4,000/°C, when rapid temperature rising is attempted for a wafer exchange or set temperature change, a temperature control is not successful and the temperature variation of the wafer cannot be reduced in a wafer heating apparatus which uses a single substance of metal like Au, Ag or Pt as the heat-generating resistor. SOLUTION: The resistance value distribution of the heat-generating resistor is adjusted on the heat equalizing plate of the wafer heating apparatus by making small the part of the resistance values of the heat-generating resistor. COPYRIGHT: (C)2007,JPO&INPIT
申请公布号 JP2007096313(A) 申请公布日期 2007.04.12
申请号 JP20060261126 申请日期 2006.09.26
申请人 KYOCERA CORP 发明人 EJIMA TOSHIMI;TANAKA SATOSHI
分类号 H01L21/02;H01L21/027;H01L21/205;H05B3/10;H05B3/74;H05B3/84 主分类号 H01L21/02
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