| 摘要 |
PROBLEM TO BE SOLVED: To provide an IC tester capable of performing a test accurately. SOLUTION: An IC tester for testing a tested object is improved. The improved IC tester comprises a first current apply section for outputting current to the tested object and a second current apply section that outputs small current more accurately than in the first current apply section, adds it to the output current of the first current apply section, and outputs it to the tested object. COPYRIGHT: (C)2007,JPO&INPIT
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