| 摘要 |
PROBLEM TO BE SOLVED: To provide a contact probe and a probe card capable of rotating a plunger according to the reactive force from test bodies, with a simple mechanism. SOLUTION: A ridgeline 15 extending linearly in the direction tilting to a central axis A1 is formed in a position deviated from the central axis A1 at the leading edge 12a of a plunger so as to put a part of the ridgeline 15 into contact with a solder ball as a contact section. Since the ridgeline 15 does not intersect with the central axis A1 of the plunger, the reactive force posed from solder ball at the contact section can be acted toward a direction deviated from the central axis A1 of plunger. Thereby, the plunger can be rotated in response to the reactive force from the solder ball, with a simple mechanism. COPYRIGHT: (C)2007,JPO&INPIT
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