发明名称 A METHOD AND APPARATUS FOR A METALLIC DRY-FILLING PROCESS
摘要 An iPVD system (200A, 200B) is programmed to deposit uniform material (115, 120), such as a metallic material, into high aspect ratio nano-sized features (110) on semiconductor substrates (105) using a process that enhances the feature filling (130C) compared to the field deposition (106), while maximizing the size of the grain features in the deposited material opening (140) at the top of the feature during the process. Sequential deposition and etching are provided by controlling DC and high density power levels and other parameters.
申请公布号 WO2007041469(A2) 申请公布日期 2007.04.12
申请号 WO2006US38390 申请日期 2006.09.27
申请人 TOKYO ELECTRON LIMITED;TOKYO ELECTRON AMERICA, INC.;CERIO, FRANK, M., JR. 发明人 CERIO, FRANK, M., JR.
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