Method for determining the sensitivity characteristic of a linear array of optoelectronic sensor elements involves repeatedly exposing the array with a light field, moving the array between two exposures and further processing

摘要

Method for determining the sensitivity characteristic of a linear array of optoelectronic sensor elements involves repeatedly exposing the array with a light field which has an inhomogeneous distribution of radiation intensity over its surface, moving the array between two exposures in directions X or Y so that each sensor element is subjected to different radiation intensities, determining the measured values of the individual sensor elements for each exposure and determining a sensitivity characteristic for the whole array from the measured results. Preferred Features: The sensitivity characteristic is determined as a relative value of the sensitivity of the sensor elements to each other.