| 摘要 |
<P>PROBLEM TO BE SOLVED: To provide an inspection and/or regulation method for an electronic device, and a contact structure for a probe pin, capable of accurately inspecting and/or regulating the electronic device, even if a probe pin is abraded or even if a terminal part contacting with the probe pin becomes contaminated. <P>SOLUTION: The plurality of probe pins 60, 60 that are integrated electrically each other are brought into contact with the same terminal part 24 with the same timing, in this inspection and/or regulation method for the electronic device constituted to input and output a signal between an electronic component and the probe pin 60, by bringing the probe pin 60 into contact with the terminal part 24 connected electrically to the electronic component. <P>COPYRIGHT: (C)2007,JPO&INPIT |
