发明名称 RESIST COMPOSITION AND PROCESS FOR FORMATION OF RESIST PATTERNS
摘要 <p>A resist composition that includes a base material component (A), which contains acid-dissociable, dissolution-inhibiting groups and exhibits increased alkali solubility under the action of acid, an acid generator component (B) that generates acid on exposure, and an organic solvent (C), in which the components (A) and (B) are dissolved in the organic solvent (C), wherein the base material component (A) contains a protected form (A1) of a polyhydric phenol compound (a) having two or more phenolic hydroxyl groups and a molecular weight within a range from 300 to 2,500, in which either a portion of, or all of, the phenolic hydroxyl groups are protected with acid-dissociable, dissolution-inhibiting groups, and the organic solvent (C) comprises an alcohol.</p>
申请公布号 KR20070039611(A) 申请公布日期 2007.04.12
申请号 KR20077004936 申请日期 2007.02.28
申请人 TOKYO OHKA KOGYO CO., LTD. 发明人 HIRAYAMA TAKU;SHIONO DAIJU;HADA HIDEO
分类号 G03F7/004;H01L21/027 主分类号 G03F7/004
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