发明名称 Method and structure for a 1T-RAM bit cell and macro
摘要 A one transistor (1T-RAM) bit cell and method for manufacture are provided. A metal-insulator-metal (MIM) capacitor structure and method of manufacturing it in an integrated process that includes a finFET transistor for the 1T-RAM bit cell is provided. In some embodiments, the finFET transistor and MIM capacitor are formed in a memory region and an asymmetric processing method is disclosed, which allows planar MOSFET transistors to be formed in another region of a single device. In some embodiments, the 1T-RAM cell and additional transistors may be combined to form a macro cell, multiple macro cells may form an integrated circuit. The MIM capacitors may include nanoparticles or nanostructures to increase the effective capacitance. The finFET transistors may be formed over an insulator. The MIM capacitors may be formed in interlevel insulator layers above the substrate. The process provided to manufacture the structure may advantageously use conventional photomasks.
申请公布号 US2007080387(A1) 申请公布日期 2007.04.12
申请号 US20050246318 申请日期 2005.10.07
申请人 TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD. 发明人 LIU SHENG-DA;CHEN HUNG-WEI;CHANG CHANG-YUN;XUAN ZHONG T.;HSU JU-WANG
分类号 H01L27/108 主分类号 H01L27/108
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