发明名称 CATHODE-COUPLING PLASMA CVD EQUIPMENT AND THIN FILM MANUFACTURING METHOD BY IT
摘要 PROBLEM TO BE SOLVED: To suppress the temperature rise of a deposition substrate, and to reduce membrane stress in a formed film by controlling high frequency power and a self bias voltage independently to an arbitrary value in cathode-coupling plasma CVD equipment. SOLUTION: A low pass filter coil and a variable resistor are connected in series between a cathode electrode and a coupling capacitor and grounded. Consequently, the self bias voltage is reduced without decreasing the high frequency voltage. Accordingly, it becomes possible to prevent the temperature rise of the deposition substrate, and to form a low stress film while keeping plasma density as high as that of a conventional cathode-coupling plasma CVD. COPYRIGHT: (C)2007,JPO&INPIT
申请公布号 JP2007096051(A) 申请公布日期 2007.04.12
申请号 JP20050284461 申请日期 2005.09.29
申请人 SAMCO INC 发明人 OGISHI ATSUFUMI;KATAYAMA DAISUKE;KUSUDA YUTAKA;MOTOYAMA SHINICHI
分类号 H01L21/31;C23C16/509 主分类号 H01L21/31
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