发明名称 |
METHOD OF FORMING METAL WIRING STRUCTURE |
摘要 |
PROBLEM TO BE SOLVED: To provide a method of forming a metal wiring structure. SOLUTION: A method of forming a metal wiring structure comprises: a step of sequentially forming a first insulating layer and a second insulating layer on a semiconductor substrate; a step of selectively etching the second insulating layer and the first insulating layer in sequence to define a contact hole; a step of forming a first metal layer extending on the second insulating layer and into the contact hole; a step of patterning the first metal layer to expose the second insulating layer; a step of selectively etching the second insulating layer by using the patterned first metal layer as an etching mask for sufficient duration to expose the first insulating layer and a metal plug in the contact hole; a step of filling a seam within the exposed metal plug with a conductive filler material; and a step of forming a second metal layer on the metal plug. This method can reduce metal defects (such as a short circuit in metal wiring) that may degrade a device yield after back-end processing steps have been completed. COPYRIGHT: (C)2007,JPO&INPIT |
申请公布号 |
JP2007096324(A) |
申请公布日期 |
2007.04.12 |
申请号 |
JP20060265462 |
申请日期 |
2006.09.28 |
申请人 |
SAMSUNG ELECTRONICS CO LTD |
发明人 |
LEE KYOUNG-WOO;GU JIKIN;PARK WAN-JAE;HONG DUK-HO |
分类号 |
H01L21/768 |
主分类号 |
H01L21/768 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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