发明名称 METHOD OF FORMING METAL WIRING STRUCTURE
摘要 PROBLEM TO BE SOLVED: To provide a method of forming a metal wiring structure. SOLUTION: A method of forming a metal wiring structure comprises: a step of sequentially forming a first insulating layer and a second insulating layer on a semiconductor substrate; a step of selectively etching the second insulating layer and the first insulating layer in sequence to define a contact hole; a step of forming a first metal layer extending on the second insulating layer and into the contact hole; a step of patterning the first metal layer to expose the second insulating layer; a step of selectively etching the second insulating layer by using the patterned first metal layer as an etching mask for sufficient duration to expose the first insulating layer and a metal plug in the contact hole; a step of filling a seam within the exposed metal plug with a conductive filler material; and a step of forming a second metal layer on the metal plug. This method can reduce metal defects (such as a short circuit in metal wiring) that may degrade a device yield after back-end processing steps have been completed. COPYRIGHT: (C)2007,JPO&INPIT
申请公布号 JP2007096324(A) 申请公布日期 2007.04.12
申请号 JP20060265462 申请日期 2006.09.28
申请人 SAMSUNG ELECTRONICS CO LTD 发明人 LEE KYOUNG-WOO;GU JIKIN;PARK WAN-JAE;HONG DUK-HO
分类号 H01L21/768 主分类号 H01L21/768
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