发明名称 OVERLAY TARGET FOR POLARIZATION LITHOGRAPHY
摘要 <P>PROBLEM TO BE SOLVED: To provide a target for being used in a polarization lithography and its use method. <P>SOLUTION: Included therein are a first structural part positioned on a reference layer and a second structural part positioned on a second layer. The second layer has a light transmittance property so that the first structural part is visible through the second layer. The second structural part is formed of a photomask having a plurality of sub-structural parts. Every sub-structural part of the plurality of sub-structural parts is oriented in a first orientation direction. Polarization is used for patterning the second structural part on the second layer, and the polarization has the same polarization direction as the first orientation direction. <P>COPYRIGHT: (C)2007,JPO&INPIT
申请公布号 JP2007096292(A) 申请公布日期 2007.04.12
申请号 JP20060238194 申请日期 2006.09.01
申请人 INFINEON TECHNOLOGIES AG 发明人 MAROKKEY SAJAN
分类号 H01L21/027;G03F1/08;G03F7/20 主分类号 H01L21/027
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