发明名称 EYE REFRACTION MEASURING APPARATUS
摘要 <P>PROBLEM TO BE SOLVED: To save the labor hour of an examiner and allow the examiner to appropriately confirm a cause of a measurement error or the lowering of reliability of measurement results. <P>SOLUTION: This eye refraction measuring apparatus which measures the refraction of a subject's eye by projecting a measurement index on a subject's ocular fundus and allowing a two-dimensional image pickup device to capture an ocular fundus reflected image reflected from the ocular fundus; is provided with a measurement determination means determining whether a measurement image satisfies prescribed measuring conditions or not, a first display mode displaying the measurement image on a display monitor when the measurement determination means determines it as a measurement error, a second mode displaying the measurement image on the display monitor irrelevant to the determination result of the measurement determination means, and a mode selection switch selecting whether using the first display mode or using the second display mode. <P>COPYRIGHT: (C)2007,JPO&INPIT
申请公布号 JP2007089715(A) 申请公布日期 2007.04.12
申请号 JP20050280971 申请日期 2005.09.27
申请人 NIDEK CO LTD 发明人 ISOGAI NAOKI
分类号 A61B3/10 主分类号 A61B3/10
代理机构 代理人
主权项
地址