| 摘要 |
Embodiments of the invention provide an HDD functional test apparatus which can test an HDD in a shorter time by increasing the amount of transfer per command without using a larger memory resource. In one embodiment, a data storage device test apparatus comprises a storage section to store original data; a data generating section which generates transfer data, larger in size than the original data, for each command to a data storage device by repeatedly using the original data; and a transfer section which transfers the generated transfer data to the data storage device.
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