发明名称 |
CONNECTING DEVICE AND INSPECTION METHOD FOR DEVICE TO BE INSPECTED |
摘要 |
PROBLEM TO BE SOLVED: To provide a connection device high in productivity also suitable for inspecting characteristics of a device to be inspected in a high temperature environment. SOLUTION: The connecting device of this invention includes contacts for electrically connecting with the device to be inspected comprises: the support plate 10; the first and the second height adjusting blocks 20 fixed on the support plate 10 and separated to each other; the first contact base member 30 fixed on the first height adjusting blocks 20 provided with the first through holes 36; the second contact base members 30 fixed on the second height adjusting blocks 20 provided with the second through holes 36; the first contact pieces 36a positioned by passing through the first through holes 36; and the second contact pieces 36a positioned by passing through the second through holes 36. COPYRIGHT: (C)2007,JPO&INPIT
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申请公布号 |
JP2007093320(A) |
申请公布日期 |
2007.04.12 |
申请号 |
JP20050281121 |
申请日期 |
2005.09.28 |
申请人 |
SEIKO EPSON CORP;TOKUSO RIKEN:KK |
发明人 |
TAMURA RYOHEI;MARUYAMA DAISUKE;OKUHARA AKISHI;OGUCHI AKIRA;ITO HIROBUMI;YANAGIDAIRA HAJIME |
分类号 |
G01R1/06;G01R31/26;H01L21/66 |
主分类号 |
G01R1/06 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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