发明名称 CONNECTING DEVICE AND INSPECTION METHOD FOR DEVICE TO BE INSPECTED
摘要 PROBLEM TO BE SOLVED: To provide a connection device high in productivity also suitable for inspecting characteristics of a device to be inspected in a high temperature environment. SOLUTION: The connecting device of this invention includes contacts for electrically connecting with the device to be inspected comprises: the support plate 10; the first and the second height adjusting blocks 20 fixed on the support plate 10 and separated to each other; the first contact base member 30 fixed on the first height adjusting blocks 20 provided with the first through holes 36; the second contact base members 30 fixed on the second height adjusting blocks 20 provided with the second through holes 36; the first contact pieces 36a positioned by passing through the first through holes 36; and the second contact pieces 36a positioned by passing through the second through holes 36. COPYRIGHT: (C)2007,JPO&INPIT
申请公布号 JP2007093320(A) 申请公布日期 2007.04.12
申请号 JP20050281121 申请日期 2005.09.28
申请人 SEIKO EPSON CORP;TOKUSO RIKEN:KK 发明人 TAMURA RYOHEI;MARUYAMA DAISUKE;OKUHARA AKISHI;OGUCHI AKIRA;ITO HIROBUMI;YANAGIDAIRA HAJIME
分类号 G01R1/06;G01R31/26;H01L21/66 主分类号 G01R1/06
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