发明名称
摘要 A plasma processing method includes exhausting the interior of a vacuum chamber while supplying gas into the vacuum chamber while maintaining the interior of the vacuum chamber at a desired pressure. A high-frequency power of 100 kHz to 100 MHz is applied to a coil provided in the vicinity of a dielectric window which faces a substrate placed on a substrate electrode in the vacuum. Plasma is generated in the vacuum chamber to process the substrate or a film on the substrate. Particles which tend to move straight from a surface of the substrate or from a surface of the film on the substrate toward a wall surface of the dielectric window inside the vacuum chamber are kept interrupted by a metal plate.
申请公布号 JP3903730(B2) 申请公布日期 2007.04.11
申请号 JP20010105443 申请日期 2001.04.04
申请人 发明人
分类号 C23F4/00;H01L21/3065;C30B33/12;H01J37/32;H01L21/28;H01L21/302;H01L21/3213;H01L21/8242;H01L21/8246;H01L27/105;H01L27/108 主分类号 C23F4/00
代理机构 代理人
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