REFLECTION TYPE TERAHERTZ SPECTROMETER AND SPECTROMETRIC METHOD

摘要

A reflection-type terahertz spectrometer comprises an input optical path (1) through which terahertz waves are propagated, an irradiating means (2) which irradiates a sample with terahertz waves propagated through the input optical path (1), an output optical path (3) through which terahertz waves having exiting from the irradiating means (2) are propagated, and a detecting means (4) which receives and detects the terahertz waves propagated through the output optical path (3), and is characterized in that the irradiating means (2) has at least one planar interface (21) and a refractive index greater than that of a peripheral region contacting the planar interface (21) and is disposed between the input optical path (1) and the output optical path (3) such that the terahertz waves propagated through the input optical path (1) to be incident on the planar interface (21) undergo total internal reflection at the planar interface (21), and the sample is disposed in the peripheral region contacting the planar interface (21) of the irradiating means (2), and when the terahertz waves undergo the total internal reflection at the planar interface (21), the sample is irradiated with evanescent waves scattering from the planar interface (21) to the peripheral region contacting the planar interface (21), so as to measure a spectrum.