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发明名称
Memory cell programming method with detection of transconductance degradation
摘要
申请公布号
EP1630820(B1)
申请公布日期
2007.04.11
申请号
EP20050015927
申请日期
2005.07.22
申请人
STMICROELECTRONICS SA
发明人
DEVIN, JEAN
分类号
G11C16/34;G11C16/10
主分类号
G11C16/34
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