发明名称 Method of forming uniform ultra-thin oxynitride layers
摘要 Ultra-thin oxynitride layers are formed utilizing low-pressure processing to achieve self-limiting oxidation of substrates and provide ultra-thin oxynitride. The substrates to be processed can contain an initial dielectric layer such as an oxide layer, an oxynitride layer, or a nitride layer, or alternatively can lack an initial dielectric layer. The processing can be carried out using a batch type process chamber or a single-wafer process chamber.
申请公布号 US7202186(B2) 申请公布日期 2007.04.10
申请号 US20030630970 申请日期 2003.07.31
申请人 INTERNATIONAL BUSINESS MACHINES CORPORATION (IBM) 发明人 O'MEARA DAVID L;WAJDA CORY;DIP ANTHONY;TOELLER MICHAEL;FURUKAWA TOSHIHARA;SCHEER KRISTEN;CALLEGARI ALESSANDRO;BUEHRER FRED;ZAFAR SUFI;GOUSEV EVGENI;CHOU ANTHONY;HIGGINS PAUL
分类号 H01L21/31;C23C16/30;H01L21/00;H01L21/28;H01L21/314;H01L21/316;H01L21/469;H01L29/51 主分类号 H01L21/31
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