发明名称 Semiconductor memory unit with repair circuit
摘要 A semiconductor memory unit with a repair circuit includes a controller, a 2-to-1 selector, an address decoder and an address comparator. The controller supplies the 2-to-1 selector and the address comparator with a setup signal to carry out the following control. When the 2-to-1 selector is controlled to supply the address decoder with a repair address signal, the address comparator is controlled to have a repair signal information holding section, which is installed in the address comparator, hold the repair address decoded by the address decoder. When the 2-to-1 selector is controlled to supply the address decoder with a read/write address signal, the address comparator is controlled to compare the read/write address with the repair address. The semiconductor memory unit can obviate the need for a repair address decoder, thereby reducing the unit area.
申请公布号 US7203870(B2) 申请公布日期 2007.04.10
申请号 US20020330165 申请日期 2002.12.30
申请人 RENESAS TECHNOLOGY CORP. 发明人 MIYANISHI ATSUSHI
分类号 G11C29/04;G11C29/24;G06F11/00;G11C7/00;G11C29/00;G11C29/20 主分类号 G11C29/04
代理机构 代理人
主权项
地址